Non-robust versus robust [test generation]
- Resource Type
- Conference
- Authors
- Pierzynska, A.; Pilarski, S.
- Source
- Proceedings of 1995 IEEE International Test Conference (ITC) International test conference Test Conference, 1995. Proceedings., International. :123-131 1995
- Subject
- Components, Circuits, Devices and Systems
Signal Processing and Analysis
Power, Energy and Industry Applications
Robustness
Circuit testing
Circuit faults
Electrical fault detection
Fault detection
Logic testing
Logic circuits
Propagation delay
Combinational circuits
Councils
- Language
- ISSN
- 1089-3539
We show that a path delay under a non-robust test may be longer than under any robust test. Thus, for a given path, a non-robust test can detect a delay fault undetectable by robust tests. This can happen even in a circuit in which all paths are robust-testable.