Accurate Measurement for Surface Resistance of a Single Piece of HTS Thin Film
- Resource Type
- Conference
- Authors
- Zeng, Cheng; Luo, Zhengxiang; Yang, Kai; Zhang, Qishao
- Source
- 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on. :1-4 Apr, 2009
- Subject
- Components, Circuits, Devices and Systems
Surface resistance
Electrical resistance measurement
High temperature superconductors
Transistors
Superconducting thin films
Tellurium
Frequency measurement
Frequency dependence
Yttrium compounds
Yttrium barium copper oxide
- Language
- ISSN
- 2324-8475
2324-8491
An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE 011 mode of this resonator. TE 012 mode of this resonator was also used in the measurement for the determination of the frequency dependence of the surface resistance of the HTS thin film. The high accuracy in the R s measurement of this resonator is comparable to the one of conventional two-resonator method, while the process is much simpler. The ability for measuring surface resistance of a single HTS thin film and characterizing the frequency dependence of R s of this sapphire resonator is remarkable.