BIST and delay fault detection
- Resource Type
- Conference
- Authors
- Pilarski, S.; Pierzynska, A.
- Source
- Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :236-242 1993
- Subject
- Components, Circuits, Devices and Systems
Signal Processing and Analysis
Power, Energy and Industry Applications
Built-in self-test
Fault detection
Circuit faults
Circuit testing
Automatic testing
Test pattern generators
Electrical fault detection
Robustness
Delay effects
Clocks
- Language
We propose simple modifications to existing BIST schemes. These modifications significantly improve the path delay fault coverage. For example, a modified circular self-test path can detect a significant number of path delay faults within a reasonable test running time.ETX