Further Results of Temperature Compensated Crystal Oscillator Testing
- Resource Type
- Conference
- Source
- 38th Annual Symposium on Frequency Control 38th Annual Symposium on Frequency Control. 1984. :507-510 1984
- Subject
Engineered Materials, Dielectrics and Plasmas Components, Circuits, Devices and Systems Fields, Waves and Electromagnetics Temperature Oscillators Testing Aging Stability Frequency measurement History US Government Protection Degradation - Language