On downconverter noise characterization for LO waveform sensitivities
- Resource Type
- Conference
- Authors
- Martens, J.
- Source
- 2024 102nd ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2024 102nd. :1-4 Jan, 2024
- Subject
- Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
Microwave measurement
Sensitivity
Millimeter wave measurements
Harmonic analysis
Hardware
Noise measurement
Mixers
frequency conversion
mixer noise
noise measurement
- Language
- ISSN
- 2767-8776
Downconverter noise behavior can have a dependence on LO waveform details in some circumstances and may be of particular interest in mm-wave/sub-THz applications where multiplied LO noise can be large. A pseudo-systematic characterization process may help in the evaluation of these effects. A composite LO based on summing in the 2 nd and 3 rd harmonics with controllable phase and amplitude, additional tones for discrete evaluation and coupled waveform monitoring are part of the proposed hardware construct. Repeatabilities ~< 1 dB for converters operating to 330 GHz were observed. In example measurements, topological effects on the waveform dependence were noted as were similarities between a millimeter-wave converter with a large LO multiple and simple diode-based fundamental mixers.