Extension to the Serial Vector Format Specification Supporting Testing of Analog Units of Safety-Critical Embedded Systems
- Resource Type
- Conference
- Authors
- Kohut, Jozsef; Molnar, Zsolt
- Source
- 2023 IEEE 6th International Conference and Workshop Óbuda on Electrical and Power Engineering (CANDO-EPE) Electrical and Power Engineering (CANDO-EPE), 2023 IEEE 6th International Conference and Workshop Óbuda on. :000353-000358 Oct, 2023
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineering Profession
General Topics for Engineers
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Voltage measurement
Embedded systems
Current measurement
Built-in self-test
Analog circuits
Safety
Digital circuits
Safety Critical Embedded System
Built-in Self-test
boundary scan
IEEE 1149
SVF
mixed signal testing
- Language
- ISSN
- 2831-4506
In safety-critical embedded systems, the built-in self-test is an important tool to increase reliability. Embedded self-test solutions for digital circuits are much more sophisticated than for analog circuits. In this paper, my goal is to facilitate the built-in self-testing of analog circuit components and subcircuits using the solution described here. I am trying to achieve this by extending the SVF specification used for boundary scan testing of digital circuits. With the extended command set, it is possible to generate excitation current signals to measure the parameters of analog components or subcircuits, and to detect and measure the response voltages of the circuit.