Total Ionizing Dose and Proton Single Event Effects in AMD Ryzen Processor Fabricated in a 12-nm Bulk FinFET Process
- Resource Type
- Conference
- Authors
- Taggart, Jennifer L.; Davis, Scott C.; Daniel, Richard; Foran, Brendan J.; Bohra, Dhruv L.; Hall, Andrew J.; Wright, Aaron W.; Hunnicutt, Hope
- Source
- 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023 IEEE. :1-6 Jul, 2023
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Protons
Degradation
Memory management
Graphics processing units
Random access memory
Voltage
Central Processing Unit
COTS
finFET
Processors
Radiation Effects
- Language
- ISSN
- 2154-0535
The Aerospace Corporation performed total ionizing dose (TID) and proton testing on the AMD Ryzen 3200G processor. The Ryzen processor is a system on chip that contains a 4-core central processing unit (CPU) and an integrated graphical processing unit (GPU). No changes in CPU performance were observed until 600 krad(Si) of dose, while changes to GPU performance were first noticed at 500 krad(Si). Degradation in CPU performance was only observed in processes requiring access to off chip memory, suggesting that radiation effects are most prevalent in the I/O circuitry and not in the digital logic or internal registers.