Semiconductor Laser Chip Damage Detection Based on the Improved YOLOv8 Algorithm
- Resource Type
- Conference
- Authors
- Zhou, Jianwei; Tian, Feng; Li, Yutian; Wang, Jue; Tian, Qinghua; Zhang, Qi; Gao, Wei; Zhuang, Ying
- Source
- 2023 21st International Conference on Optical Communications and Networks (ICOCN) Optical Communications and Networks (ICOCN), 2023 21st International Conference on. :1-3 Jul, 2023
- Subject
- Communication, Networking and Broadcast Technologies
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Signal Processing and Analysis
Semiconductor lasers
Optical fiber communication
Semiconductor Laser Chip
Damage Detecting
Deep Learning
- Language
- ISSN
- 2771-3059
We proposed an improved YOLOv8 algorithm and verified it through experiments. The results show that our proposed algorithm has $0.98 \mathrm{~ms}$ and $2.90 \%$ performance improvement on the average detection time and mAP@0.5:0.95, respectively.