Fault Detection based on Perturbation Observer of Open-circuit Fault in Cascaded H-bridge STATCOM
- Resource Type
- Conference
- Authors
- Fan, Chenxi; Xiahou, Kaishun; Wu, Q.H.
- Source
- 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :2699-2704 May, 2023
- Subject
- Engineered Materials, Dielectrics and Plasmas
Power, Energy and Industry Applications
Insulated gate bipolar transistors
Voltage measurement
Perturbation methods
Fault detection
Simulation
Switches
Observers
cascaded H-bridge STATCOM
fault detection
perturbation observer
open circuit fault
- Language
This paper presents a perturbation observer-based fault detection method to detect the multiple open-circuit switch faults of cascaded H-bridge STATCOM. Based on analysis of open-circuit fault characteristics of insulated gate bipolar transistor (IGBT), two perturbation observers of current and voltage are used to detect swiftly open-circuit fault. By using the difference of measured value and the observed valued of arm current and voltage, the faulty SM can be distinguished and located. Simulation results have confirmed that the proposed perturbation observer-based method has better detection performance compared with sliding mode observer (SMO).