结合椭圆偏振光谱与傅里叶红外光谱的宽禁带半导体薄膜光学特性表征 / Characterization of Optical Properties of Wide Band Gap Semiconductor Thin Film with the Combination of Ellipsometry and Infrared Spectrum
- Resource Type
- Academic Journal
- Source
- 光散射学报 / The Journal of Light Scattering. 28(3):214-219
- Subject
椭圆偏振光谱 傅里叶红外光谱 传输矩阵方法 spectroscopic ellipsometry Fourier transform infrared spectroscopy transfer matrix method - Language
- Chinese
- ISSN
- 1004-5929