ToF-SIMS, Time-of-Flight Secondary Ion Mass Spectroscopy for Counterfeit Detection of Electrical, Electronic, and Electromechanical (EEE) Parts
- Resource Type
- Source
- International Symposium for Testing and Failure Analysis.
- Subject
Materials science Time of flight secondary ion mass spectroscopy Analytical chemistry Counterfeit - Language
- ISSN
- 0890-1740