X-ray topography characterization of gallium nitride substrates for power device development
- Resource Type
- Article
- Authors
- Raghothamachar, Balaji; Liu, Yafei; Peng, Hongyu; Ailihumaer, Tuerxun; Dudley, Michael; Shahedipour-Sandvik, F. Shadi; Jones, Kenneth A.; Armstrong, Andrew; Allerman, Andrew A.; Han, Jung; Fu, Houqiang; Fu, Kai; Zhao, Yuji
- Source
- In Journal of Crystal Growth 15 August 2020 544
- Subject
- Language
- ISSN
- 0022-0248