List of contributors
- Resource Type
- Authors
- Alumbaugh, David; Bao, Yong; Cao, Zhang; Chowdhury, Shah M.; Collins, Sean M.; Daun, Kyle; Dong, Feng; Fan, Liang-Shih; Faraj, Yousef; Grauer, Samuel J.; Hampel, Uwe; Holland, Daniel J.; Hoyle, Brian S.; Jia, Jiabin; Kantzas, Apostolos; Kawashima, Daisuke; Khambampati, Anil Kumar; Kim, Kyung Youn; Kim, Sin; Liu, Chang; Machin, Thomas D.; Marashdeh, Qussai; McCann, Hugh; Mohamad-Saleh, Junita; Mosorov, Volodymyr; Mylvaganam, Saba; Parker, David; Peyton, Anthony J.; Primrose, Ken; Sederman, Andrew J.; Sharifi, Mohadeseh; Straiton, Benjamin; Takei, Masahiro; Tan, Chao; Teixeira, Fernando L.; Wagner, Steven; Wang, Aining; Wang, Mi; Wang, Qiang; Watson, Nicholas James; Wilt, Michael; Wright, Paul; Xie, Cheng-gang; Xu, Lijun; Young, Brent; Zhao, Yanlin
- Source
- In Industrial Tomography Edition: Second Edition. 2022:xv-xvii
- Subject
- Language