Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction
- Resource Type
- Article
- Authors
- Zhang, Hong-Di; Li, Zhao-Jian; Long, Yun-Ze; Xie, Hong-Wei; Sun, Bin; Lu, Hui-Bin; Mai, Zhen-Hong
- Source
- Journal of Crystal Growth. Mar2013, Vol. 366, p39-42. 4p.
- Subject
- *SINGLE crystals
*LANTHANUM compounds
*STRONTIUM compounds
*NANOFILMS
*SYNCHROTRON radiation
*X-ray diffraction
*RESIDUAL stresses
*SUBSTRATES (Materials science)
- Language
- ISSN
- 0022-0248
Abstract: Residual stresses in ultrathin La0.9Sr0.1MnO3 (LSMO) films with various thicknesses of 8–40nm were measured quantitatively via synchrotron radiation X-ray diffraction. By fitting the strain versus plots the residual stresses in the nanofilms were obtained. With increasing film thickness, both the in- and out-of-plane stresses decreased for strain relaxation. The strains of LSMO nanofilms on miscut SrTiO3 (STO) substrates were weaker than those on exact-cut ones with same thickness, which indicates that the crystallization in nanofilms on miscut SrTiO3 was more perfect than that on exact-cut SrTiO3. The mechanism is discussed briefly based on the minimization of surface energy and strain energy. [Copyright &y& Elsevier]