Origin of Hopping Conduction in Sn-Doped Silicon Oxide RRAM With Supercritical \CO2 Fluid Treatment.
- Resource Type
- Article
- Source
- IEEE Electron Device Letters; Dec2012, Vol. 33 Issue 12, p1693-1695, 3p
- Subject
HOPPING conduction NONVOLATILE random-access memory SUPERCRITICAL fluids SILICON oxide films GALLIUM nitride CARBON dioxide - Language
- ISSN
- 07413106