Methods for calculating electrostatic quantities due to a free charge in a nanoscale three-dimensional tip/base junction.
- Resource Type
- Article
- Authors
- Peridier, Vallorie J.; Pan, Li-Hong; Sullivan, Thomas E.
- Source
- Journal of Applied Physics. 10/15/1995, Vol. 78 Issue 8, p4888. 7p.
- Subject
- *ELECTROSTATICS
*SCANNING tunneling microscopy
- Language
- ISSN
- 0021-8979
Presents information on a study wherein the exact solutions for fully three-dimensional electrostatic quantities due to a free charge in a nanoscale tip/base junction, such as the scanning-tunneling microscope, are given for the problem as modeled in the prolate-spheroidal coordinate system. Methods; Results; Discussion.