Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data.
- Resource Type
- Article
- Authors
- Xu, Qiuhao; Xu, Chuqiao; Wang, Junliang
- Source
- Autonomous Intelligent Systems; Dec2022, Vol. 2 Issue 1, p1-16, 16p
- Subject
- FEATURE selection
GENETIC algorithms
DATA distribution
MANUFACTURING defects
MANUFACTURING processes
FORECASTING
MACHINE learning
- Language
- ISSN
- 2730616X
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