Effect of electronic transitions on near edge optical properties of off-stoichiometric boron carbide thin films.
- Resource Type
- Article
- Authors
- Modi, Mohammed H.; Gupta, Rajkumar; Yadav, Praveen K.; Gupta, Shruti; Mukherjee, C.; Idir, Mourad
- Source
- Journal of Applied Physics. 4/28/2023, Vol. 133 Issue 16, p1-7. 7p.
- Subject
- *BORON carbides
*THIN films
*OPTICAL properties
*X-ray photoelectron spectroscopy
*SOFT X rays
*CHEMICAL structure
- Language
- ISSN
- 0021-8979
In the present study, soft x-ray optical properties of off-stoichiometric boron carbide thin films are investigated, and the structure and chemical composition of the film is analyzed using angle dependent x-ray reflectivity and x-ray photoelectron spectroscopy techniques. Energy dependent soft x-ray reflectivity measured at a fixed grazing angle of 1.5° is used to determine the optical constants in the boron K edge region by applying the Kramers–Kronig technique. The measured optical constants show near edge fine features corresponding to σ* and π* resonances. The electronic transitions corresponding to σ* resonance cause a 40%–75% increase in the delta value in the above boron K edge region. The π* transitions corresponding to off-stoichiometric nature of the boron carbide are observed in the absorption spectra near ∼192.7 eV. Details of the measured soft x-ray optical properties of the off-stoichiometric boron carbide thin film are discussed. [ABSTRACT FROM AUTHOR]