Abnormal Threshold Voltage Shift and Sub-channel Generation in Top-Gate InGaZnO TFTs under Backlight Negative Bias Illumination Stress.
- Resource Type
- Article
- Source
- ACS Applied Electronic Materials; 2/28/2023, Vol. 5 Issue 2, p1183-1188, 6p
- Subject
- Language
- ISSN
- 26376113