Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions.
- Resource Type
- Article
- Source
- IEEE Electron Device Letters; May2022, Vol. 43 Issue 5, p721-724, 4p
- Subject
ELECTRON impact ionization TRANSISTORS HOT carriers THIN film transistors ELECTRON traps THRESHOLD voltage - Language
- ISSN
- 07413106