Euler's Numerical Method for Ions Rejection Reassessment of a Defect-Free Synthesized Nanofiltration Membrane with Ultrathin Titania Film as the Selective Layer.
- Resource Type
- Article
- Source
- Coatings (2079-6412); Feb2021, Vol. 11 Issue 2, p184-184, 1p
- Subject
THIN films NANOFILTRATION FIELD emission electron microscopy POLYACRYLONITRILES ATOMIC force microscopy NERNST-Planck equation - Language
- ISSN
- 20796412