Probing Deformation Mechanisms in Ultrafine Grained Al and Au Thin Films by Quantitative In Situ TEM Deformation.
- Resource Type
- Abstract
- Source
- Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p3188-3190, 3p
- Subject
- Language
- ISSN
- 14319276