Depth Analysis of Semi-Transparent Media by a Time-Correlated CMOS SPAD Line Sensor-Based Depth-Resolving Raman Spectrometer.
- Resource Type
- Article
- Source
- IEEE Sensors Journal; 8/15/2019, Vol. 19 Issue 16, p6711-6720, 10p
- Subject
- Language
- ISSN
- 1530437X