This paper presents an antivibration time-delay integration (TDI) CMOS image sensor (CIS) for small remote imaging systems, introducing a hardware-implemented online deblurring (ODB) algorithm to address the image blur problems caused by vibrations. The proposed sensor has eight TDI stages, column-parallel TDI accumulating and ODB circuits. A 256\times 8 -pixel prototype chip was fabricated using a 0.18- \mu \text{m} CIS technology with a pixel footprint of 6.5~\mu {\mathrm{ m}}\times 6.5~\mu \text{m}$ and a fill factor of 28%. Measurement results show that the sensor can achieve dynamic ranges of 45.1 and 51.8 dB, respectively, with and without enabling the ODB algorithm. Compared with a single-stage line scanner imager, it offers an improvement in signal-to-noise ratios of 1.9 and 8.6 dB, respectively, with and without the ODB algorithm. [ABSTRACT FROM AUTHOR]