IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 20(3):2406-2420 Jun, 2023
Proceedings of 1st International Symposium on Plasma Process-Induced Damage Plasma Process-Induced Damage, 1996 1st International Symposium on. :61-66 1996