2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on. :283-286 Apr, 2008
International Journal of Molecular Sciences; Volume 14; Issue 2; Pages: 2862-2874 International Journal of Molecular Sciences International Journal of Molecular Sciences, Vol 14, Iss 2, Pp 2862-2874 (2013)