2016 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2016 ieee international (2)
2019 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2019 ieee international (2)
2020 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2020 ieee international (2)
aip conference proceedings (2)
solid-state electronics (2)
2001 electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2001. eos/esd '01. (1)
2004 electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2004. eos/esd '04. (1)
2005 electrical overstress/electrostatic discharge symposium, electrical overstress/electrostatic discharge symposium, 2005. eos/esd '05. (1)
2010 ieee international reliability physics symposium, reliability physics symposium (irps), 2010 ieee international (1)
2014 ieee international reliability physics symposium (1)
2014 ieee international reliability physics symposium, reliability physics symposium, 2014 ieee international (1)
2015 37th electrical overstress/electrostatic discharge symposium (eos/esd) (1)
2015 37th electrical overstress/electrostatic discharge symposium (eos/esd), electrical overstress/electrostatic discharge symposium (eos/esd), 2015 37th (1)
2016 38th electrical overstress/electrostatic discharge symposium (eos/esd), electrical overstress/electrostatic discharge symposium (eos/esd), 2016 38th (1)
2019 31st international symposium on power semiconductor devices and ics (ispsd), power semiconductor devices and ics (ispsd), 2019 31st international symposium on (1)
electrical overstress / electrostatic discharge symposium proceedings 2012 (1)
electrical overstress / electrostatic discharge symposium proceedings 2012, electrical overstress/electrostatic discharge symposium (eos/esd), 2012 34th (1)
electrical overstress/electrostatic discharge symposium proceedings 2010, electrical overstress/ electrostatic discharge symposium (eos/esd), 2010 32nd (1)
solid state electronics (1)