microelectronics reliability (40)
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2000 gaas reliability workshop. proceedings (ieee cat. no.00th8513), gaas reliability workshop, 2000. proceedings, gaas reliability workshop (1)
2004 ieee mtt-s international microwave symposium digest (ieee cat. no.04ch37535) (1)
2004 ieee mtt-s international microwave symposium digest (ieee cat. no.04ch37535), microwave symposium digest, 2004 ieee mtt-s international, microwave symposium digest (1)
2010 ieee international reliability physics symposium (irps) (1)
2010 ieee international reliability physics symposium, reliability physics symposium (irps), 2010 ieee international (1)
2011 21st international conference on noise & fluctuations (icnf) (1)
2011 21st international conference on noise and fluctuations, noise and fluctuations (icnf), 2011 21st international conference on (1)
2011 ieee bipolar/bicmos circuits & technology meeting (bctm) (1)
2011 proceedings of the european solid-state device research conference (essderc) (1)
2012 13th international thermal, mechanical & multi-physics simulation & experiments in microelectronics & microsystems (1)
2012 13th international thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems, thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2012 13th international conference on (1)
2012 proceedings of the european solid-state device research conference (essderc) (1)
2012 proceedings of the european solid-state device research conference (essderc), solid-state device research conference (essderc), 2012 proceedings of the european (1)
2013 european microwave integrated circuit conference (1)
2013 european microwave integrated circuit conference, microwave integrated circuits conference (eumic), 2013 european (1)
2013 international conference on simulation of semiconductor processes & devices (sispad) (1)
2013 international conference on simulation of semiconductor processes and devices (sispad), simulation of semiconductor processes and devices (sispad), 2013 international conference on (1)
2015 10th international conference on availability, reliability & security (1)
2015 international conference on noise and fluctuations (icnf), noise and fluctuations (icnf), 2015 international conference on (1)
2018 19th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2018 19th international conference on (1)
2018 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2018 ieee international (1)
2018 international workshop on integrated nonlinear microwave and millimetre-wave circuits (inmmic), integrated nonlinear microwave and millimetre-wave circuits (inmmic), 2018 international workshop on (1)
2020 15th european microwave integrated circuits conference (eumic), microwave integrated circuits conference (eumic), 2020 15th european (1)
2023 35th international symposium on power semiconductor devices and ics (ispsd), power semiconductor devices and ics (ispsd), 2023 35th international symposium on (1)
2023 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2023 ieee international (1)
european gallium arsenide & other semiconductor application symposium, gaas 2005 (1)
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ieee electron device letters (1)
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ieee internationalelectron devices meeting, 2005. iedm technical digest., electron devices meeting, 2005. iedm technical digest. ieee international, international electron devices meeting 2005 (1)
ieee transactions on device & materials reliability (1)
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microwave integrated circuits conference (eumic), 2010 european (1)
proceedings of the 12th international symposium on the physical & failure analysis of integrated circuits, 2005 (ipfa 2005) (1)
proceedings of the 12th international symposium on the physical and failure analysis of integrated circuits, 2005. ipfa 2005., physical and failure analysis of integrated circuits, 2005. ipfa 2005. proceedings of the 12th international symposium on the, physical and failure analysis of integrated circuits (1)
proceedings of the 2000 gaas reliability workshop (ieee cat. no.00th8513) (1)
proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits. ipfa 2001 (cat. no.01th8548) (1)
proceedings of the 2001 8th international symposium on the physical and failure analysis of integrated circuits. ipfa 2001 (cat. no.01th8548), physical and failure analysis of integrated circuits, 2001. ipfa 2001. proceedings of the 2001 8th international symposium on the, physical and failure analysis of integrated circuits (1)
proceedings the 16th international conference on microelectronics, 2004 (icm 2004) (1)
proceedings. the 16th international conference on microelectronics, 2004. icm 2004., microelectronics, 2004. icm 2004 proceedings. the 16th international conference on, microelectronics (1)
the 5th european microwave integrated circuits conference, microwave integrated circuits conference (eumic), 2010 european (1)