Materials Science and Engineering B 73 (2000): 154–157. doi:10.1016/S0921-5107(99)00448-1 info:cnr-pdr/source/autori:M Bollani(a); L Fares(a); A Charai(a); D Narducci(b);/titolo:Chemically induced disordering of Si (100) surfaces upon SC1%2FSC2 etching analysed by high-resolution transmission electron microscopy/doi:10.1016%2FS0921-5107(99)00448-1/rivista:Materials Science and Engineering B/anno:2000/pagina_da:154/pagina_a:157/intervallo_pagine:154–157/volume:73