Interface State Density and Series Resistance of n-Type Nanocrystalline FeSi2/p-Type Si Heterojunctions Formed by Utilizing Facing-Target Direct-Current Sputtering
- Resource Type
- Journal
- Source
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY ; MAR 2018, 18 3, p1841-p1846, 6p.- Subject
- Language
- English
- ISSN
- 15334899