Characterizing the distribution of nonylphenol ethoxylate surfactants in water-based pressure-sensitive adhesive films using atomic-force and confocal Raman microscopy
- Resource Type
- Journal
- Source
JOURNAL OF PHYSICAL CHEMISTRY B ; SEP 25 2008, 112 38, p11907-p11914, 8p.- Subject
- Language
- English
- ISSN
- 15206106