EDELWEISS Read-out Electronics and Future Prospects
- Resource Type
- Original Paper
- Authors
- Censier, B.; Benoit, A.; Bres, G.; Charlieu, F.; Gascon, J.; Gironnet, J.; Grollier, M.; Guichardaz, R.; Juillard, A.; Lauro, L.; Minet, J.; Paul, B.; Vagneron, L.; The EDELWEISS Collaboration
- Source
- Journal of Low Temperature Physics. June 2012 167(5-6):645-651
- Subject
- Cryogenic electronics
Ionization
Dark matter
Noise
Energy resolution
Heat-and-ionization bolometer
- Language
- English
- ISSN
- 0022-2291
1573-7357
The read-out electronics of the EDELWEISS-II experiment is presented. Its implementation has been guided by two important design choices. The first one is putting cold electronics far from the detectors in order to attenuate possible background sources from electronic components. It implies strong constraints on noise optimization, line stray capacitance and thermal load. The second one is acquisition of fully digitized signals to minimize the E.M. noises and to take full advantage of digital processing possibilities for filtering and triggering. The resulting amplification scheme is presented for both ionization and heat channel, as well as performances of the full read-out scheme. Future prospects about the coming EDELWEISS-III experiment electronics are also discussed. This updated design takes advantage of the experience gained in previous steps of the experiment while aiming at fulfilling specific constraints of a future ton-scale experiment.