An improved I/O cell is disclosed which includes a combined p-channel and n-channel transistor pullup configuration. In particular, such combination is connected in series between the chip operating voltage V.sub.cc, and the I/O cell output pad. The n-channel transistor is biased substantially continuously on its gate terminal with a pumped voltage from a charge pump, which permits it to pass voltages up to and including V.sub.cc. The p-channel transistor operates in its normal fashion, controllable via a pullup select signal applied to its gate terminal to pull the pad high. During normal operation, the n-channel transistor is always ON, thus reducing the substantial dynamic current drawn from the charge pump. The voltage appearing on the pad is fed back to a second n-channel transistor. When the voltage on the pad exceeds V.sub.cc for example, a 5 volt signal when V.sub.cc is 3.3 volts), the second n-channel transistor switches the gate of the first n-channel transistor to a reference signal, which is a diode drop below V.sub.cc. The first n-channel transistor, in response thereto, shuts-off, thus protecting the p-channel pullup transistor from the excessive voltages appearing on the pad.