Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) :Study of the Optical Feedback Effect in VCSELs
- Resource Type
- Journal Article
- Source
- SEISAN KENKYU. 1999, 51(8):630
- Subject
- Language
- English
- ISSN
- 0037-105X
1881-2058