Application-Dependent Interconnect Testing of Xilinx FPGAs Based on Line Branches Partitioning
- Resource Type
- Journal Article
- Authors
- Dunshan YU; Jianhua FENG; Teng LIN
- Source
- IEICE Transactions on Information and Systems. 2009, E92.D(5):1197
- Subject
- FPGA
Test Configuration
application-dependent testing
line branch
- Language
- English
- ISSN
- 0916-8532
1745-1361
A novel application-dependent interconnect testing scheme of Xilinx Field Programmable Gate Arrays (FPGAs) based on line branches partitioning is presented. The targeted line branches of the interconnects in FPGAs' Application Configurations (ACs) are partitioned into multiple subsets, so that they can be tested with compatible Configurable Logic Blocks (CLBs) configurations in multiple Test Configurations (TCs). Experimental results show that for ISCAS89 and ITC99 benchmarks, this scheme can obtain a stuck-at fault coverage higher than 99% in less than 11 TCs.