In situ monitoring of ZnS/GaP and ZnSe/GaAs metalorganic vapor phase epitaxy using reflectance anisotropy spectroscopy and spectroscopic ellipsometry
- Resource Type
- Article
- Source
- In
Thin Solid Films 27 March 2000 364(1-2):12-15 - Subject
- Language
- ISSN
- 0040-6090