Development and testing of a radiation-hard large-electrode DMAPS design in a 150 nm CMOS process
- Resource Type
- Article
- Authors
- Caicedo, I.; Barbero, M.; Barrillon, P.; Bespin, C.; Breugnon, P.; Chabrillat, P.; Degerli, Y.; Dingfelder, J.; Guilloux, F.; Habib, A.; Hemperek, T.; Hirono, T.; Hügging, F.; Krüger, H.; Pangaud, P.; Rozanov, A.; Rymaszewski, P.; Schall, L.; Schwemling, P.; Vogt, M.; Wang, T.; Wermes, N.
- Source
- In Nuclear Inst. and Methods in Physics Research, A 1 October 2022 1040
- Subject
- Language
- ISSN
- 0168-9002