Redefining and testing interconnect faults in Mesh NoCs
- Resource Type
- Conference
- Authors
- Cota, E.; Kastensmidt, F.L.; Amory, A.; Cassel, M.; Lubaszewski, M.; Meirelles, P.
- Source
- 2007 IEEE International Test Conference Test Conference, 2007. ITC 2007. IEEE International. :1-10 Oct, 2007
- Subject
- Components, Circuits, Devices and Systems
Signal Processing and Analysis
Power, Energy and Industry Applications
Network-on-a-chip
Integrated circuit interconnections
Circuit faults
Routing
Power system interconnection
Switches
System testing
Circuit testing
Fault detection
Crosstalk
- Language
- ISSN
- 1089-3539
2378-2250
An extended fault model and novel strategy to tackle interconnect faults in network-on-chips are proposed. Short faults between distinct channels are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.