Accelerated life test method for storage vacuum electron device based on pressurization
- Resource Type
- Conference
- Authors
- Yuan, Huiyu; Zhang, Jin; Shen, Changsheng; Bail, Ningfeng; Fan, Hehong; Zhao, Xingqun; Sun, Xiaohan; Zhou, Jun; Sheng, Xing
- Source
- 2017 Eighteenth International Vacuum Electronics Conference (IVEC) Vacuum Electronics Conference (IVEC), 2017 Eighteenth International. :1-2 Apr, 2017
- Subject
- Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
Life estimation
Cathodes
Acceleration
Klystrons
Metals
Vacuum systems
vacuum electron device
accelerate life test
storage life
- Language
This paper proposes an accelerated life testing method for the storage vacuum electron device (VED) based on pressurization and establishes an accelerated life model. The accelerated life test of a VED is performed at 4.5 atm. The result showed that after pressurization the cathode current dropped faster than that when the VED was stored in air. The pressurization could accelerate the VED storage life.