Effect of long-time electrical and thermal stresses upon the endurance capability of cable insulation material
- Resource Type
- Periodical
- Authors
- Tzimas, A.; Rowland, S.; Dissado, L.A.; Fu, M.; Nilsson, U.H.
- Source
- IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 16(5):1436-1443 Oct, 2009
- Subject
- Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Thermal stresses
Cable insulation
Oil filled cables
Materials testing
Temperature
Thermal engineering
Insulation testing
Polyethylene
Manufacturing
Aging
Thermal stress effect, XLPE, endurance testing, cable peelings, Weibull statistics.
- Language
- ISSN
- 1070-9878
1558-4135
This paper presents the results of endurance tests that have been carried out on cross-linked polyethylene (XLPE) cable peelings. The peelings were taken from cables that were manufactured from a single batch of XLPE and subjected to electrical (up to 28 kV/mm), thermal T = 363 K (90 /SPL deg/C) and electro-thermal stressing for at least 5000 hours. The endurance tests of the peelings (thickness 150 μm) were carried out at the same temperature of T = 363 K as the thermally stressed cable, but at two different ac electrical fields of 55 and 70 kV/mm. The resulting life data for the different sample sets are compared to one another and to that of peelings taken from unaged cables. Weibull analysis of the failures shows that only peelings from cables that had experienced a thermal stress component during their time of stressing as a cable, exhibited a statistically significant reduction in endurance capability. Possible reasons for this reduction of life are discussed.