Study on the Factors of Start-up White Line Caused by Coupled Electric Field in TFT LCD
- Resource Type
- Conference
- Authors
- Li, Xin; Song, Yong; Yu, Hongjun; Che, Chuncheng; Xue, Hailin
- Source
- 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-4 Sep, 2021
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power, Energy and Industry Applications
Resistance
Integrated circuits
Couplings
Failure analysis
Voltage
Logic gates
Liquid crystal displays
Coupled electric field
Black matrix
Voltage difference
- Language
- ISSN
- 1946-1550
In this paper, we report on the factors of Start-up White Line defect caused by coupled electric field. The defect appeared near the Gate signal line of the display area at zero gray step of the start-up sequence. The failure mechanism was found out to be the coupled electric field caused by the voltage difference between the Common and Gate-Low signals. It affected the charge density in the surrounding Black Matrix and created a new electric field which disturbed the deflection of the liquid crystal. Further experiments and analysis showed that the failure was related to the voltage difference between the common and Gate-Low signals, the resistance of Black Matrix, the pattern of Black Matrix.