Timing analyzer for embedded testing
- Resource Type
- Conference
- Authors
- Frisch, A.; Almy, T.
- Source
- Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :552-555 1993
- Subject
- Components, Circuits, Devices and Systems
Signal Processing and Analysis
Power, Energy and Industry Applications
Timing
Clocks
Delay
Transceivers
Logic
Independent component analysis
Inverters
Circuit testing
Printed circuits
Circuit analysis
- Language
A 20 channel timing analyzer was designed in CMOS for embedded testing applications. The chip executes independent events in each of the channels at rates of 100 MHz, with a precision of 312.5 ps. The chip automatically adjusts for clock rates from 10 to 100 MHz and temperature/process variations, and can be calibrated to compensate for clock skew.ETX