Voltage droop adaptation is imperative in high-performance processors due to its detrimental effects on circuit timing. Conventional adaptive frequency scaling systems employing error detection and correction (EDAC) [1] facilitate the identification of the point of first failure (PoFF), yet yield binary-like outcomes precluding nanosecond-level expeditious droop detection (Fig. 1 left). Existing high-resolution voltage droop detectors (DD) offer a fine voltage quantification, but confront several challenges [2]–[6] (Fig. 1 middle). First, the DD's monitoring range must exceed the operational voltage range of the circuit under test, setting a higher standard in low-power systems with a wide voltage range. However, high-speed, high-resolution DDs exhibit low robustness and code error at low supply voltage, due to timing deterioration in cross-voltage domain critical paths. Second, the lack of a direct correlation between the voltage codes with the system's timing and a well-defined criterion for droop protection threshold results in either timing failure or excessive timing margin. Furthermore, at low VDD, the susceptibility of delay deterioration to voltage variations intensifies (Fig. 1 bottom left). Thus, robust voltage detection and adjustment methodologies are requisites across a wide voltage range.