Traditional WAT test is executed on a series of testkeys which is located in the scribe line of wafers. A transparent disadvantage of this kind of test is large amount of test time and limited number of DUT(device under test). So a different kind of WAT test is urgently needed, which combines the advantages of testing efficiency and accuracy. This paper will introduce a novel WAT test, it adopts parallel test based on specially designed testkey structure. What's more, domestic Semitronix tester is able to conduct this test, huge amount of time is saved, and testing accuracy is guaranteed.