Characterization of Low Loss Dielectric Materials for 5G Applications
- Resource Type
- Conference
- Authors
- Lee, Tzu Nien; Lau, John H; Ko, Cheng-Ta; Xia, Tim; Lin, Eagle; Yang, Henry Kai-Ming; Lin, Puru Bruce; Peng, Tony Chia-Yu; Chang, Leo; Chen, Jia Shiang; Fang, Yi-Hsiu; Liao, Li-Yueh; Charn, Edward; Wang, Jason; Tseng, Tzyy-Jang
- Source
- 2021 IEEE CPMT Symposium Japan (ICSJ) CPMT Symposium Japan (ICSJ), 2021 IEEE. :98-101 Nov, 2021
- Subject
- Bioengineering
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Dielectric constant
Impedance measurement
5G mobile communication
Dielectric materials
Dielectric losses
Dielectric loss measurement
Loss measurement
dissipation factor
dielectric constant
insertion loss
return loss
impedance
- Language
- ISSN
- 2475-8418
The dissipation factor and dielectric constant of low loss dielectric materials are measured by the Fabry-Perot open resonator technique. A coplanar waveguide with ground test vehicle is being designed and fabricated. The impedance is measured and the effective dielectric constant of the test vehicle is calculated.