Sampling method to extend bandwidth of scanning SQUID microscopes
- Resource Type
- Periodical
- Source
- IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 15(2):688-691 Jun, 2005
- Subject
Fields, Waves and Electromagnetics Engineered Materials, Dielectrics and Plasmas Sampling methods Bandwidth SQUIDs Microscopy Pulse amplifiers Voltage Magnetic fields Hysteresis Frequency Image sampling High frequency microscopy NDE SQUID - Language
- ISSN
- 1051-8223
1558-2515
2378-7074