An Efficient Yield Estimation Method for Layouts of High Dimensional and High Sigma SRAM Arrays
- Resource Type
- Conference
- Authors
- Shen, Yue; Yan, Changhao; Wang, Sheng-Guo; Zhou, Dian; Zeng, Xuan
- Source
- 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021. :1723-1728 Feb, 2021
- Subject
- Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Robotics and Control Systems
Layout
Buildings
Random access memory
Gaussian processes
Data models
Yield estimation
Iterative methods
- Language
- ISSN
- 1558-1101
This paper firstly focuses on yield estimation problem on post-layout-simulation of high dimensional SRAM arrays. Post-layout-simulation is much more credible than pre-simulation. However, it introduces strong relationship among SRAM columns. The Multi-Fidelity Gaussian Process model between the small and the large SRAM arrays near Optimal Shift Vector (OSV) is built. An iterative strategy is proposed and Multi-Modal method is applied to obtain more prior knowledge of the small SRAM arrays and further accelerate convergence. Experimental results show that the proposed method can gain 5-7x speedup with less relative errors than the state-of-the-art method for 384D cases.