An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits
- Resource Type
- Conference
- Authors
- Zhai, Jinyuan; Yan, Changhao; Wang, Sheng-Guo; Zhou, Dian
- Source
- 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2018 55th ACM/ESDA/IEEE. :1-6 Jun, 2018
- Subject
- Components, Circuits, Devices and Systems
Random access memory
Integrated circuit modeling
SPICE
Monte Carlo methods
Computational modeling
Bayes methods
Random variables
- Language
With increasing dimension of variation space and computational intensive circuit simulation, accurate and fast yield estimation of realistic SRAM chip remains a significant and complicated challenge. In this paper, du Experiment results show that the proposed method has an almost constant time complexity as the dimension increases, and gains 6× speedup over the state-of-the- art method in the 485D cases.