Bridgman growth and characterization of the structure ordered CTGS single crystal
- Resource Type
- Conference
- Authors
- Wang, H.-W.; Yu, F.-P.; Hou, S.; Chen, F.-F.; Zhan, J.; Zhao, X.
- Source
- Proceedings of the 2014 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2014 Symposium on. :247-250 Oct, 2014
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Crystals
Temperature
Temperature sensors
Piezoelectricity
Temperature dependence
Furnaces
Piezoelectric crystal
Bridgman method
CTGS
High temperature
- Language
Structural ordered langasite-type piezoelectric crystal Ca 3 Ta G a 3 Si 2 O 14 (CTGS) possess excellent high temperature piezoelectric properties. In this work, large size(25mm in diameter and 80mm in length)CTGS single crystalswere grown by using the vertical Bridgman method. High resolution X-ray diffraction technique was applied to characterize the crystal quality, where the as-grown CTGS crystals were found to show low FWHM value, being on the order of