How to Control AFM Nanoxerography for the Templated Monolayered Assembly of 2 nm Colloidal Gold Nanoparticles
- Resource Type
- Periodical
- Authors
- Ressier, L.; Palleau, E.; Garcia, C.; Viau, G.; Viallet, B.
- Source
- IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 8(4):487-491 Jul, 2009
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Assembly
Gold
Nanoparticles
Atomic force microscopy
Nanobioscience
Writing
Electrostatics
Transistors
Nanoscale devices
Nanopatterning
Atomic force microscopy (AFM)
colloidal nanoparticles
directed assembly
electrostatic nanopatterning
Kelvin force microscopy (KFM)
- Language
- ISSN
- 1536-125X
1941-0085
This paper reports on the directed monolayered assembly of 2 nm colloidal gold nanoparticles onto charge patterns written by atomic force microscopy (AFM) on poly(methylmethacrylate) thin films with a sub-100-nm spatial resolution. The impact of key experimental parameters (surface potential of charge patterns, immersion time in the colloidal solution, nanoparticle concentration, rinsing time) on the nanoparticle assembly was quantified for the first time. This study reveals that the high level of control of this so-called AFM nanoxerography process will allow one to construct promising colloid-based devices integrating localized nanoparticle monolayers of desired density.